Comparative Analysis of Sequential Circuit Test Generation Approaches
نویسندگان
چکیده
Current paper presents a comparative study of popular test pattern generation approaches based on three tools: a genetic algorithm test generator GATEST, a deterministic logic-level tool HITEC and a hierarchical tool DECIDER. The main reason for this study was to find out, which fault types are likely to be covered by different approaches. Additional motivation for the work was to find guidelines for improving the fault models implemented in the hierarchical test pattern generator DECIDER, which is being developed at TTU.
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تاریخ انتشار 2004